An accurate ISF-based analysis and simulation method for phase noise in LC/Ring oscillators

• DOI: 10.1016/j.mejo.2021.105240
• Publication Date: 2021-09-07T15:28:58Z
• Authors: Zirui Jin; Dongsheng Liu; Ang Hu; Xiaoyu Shan; Chengcheng Zhang; Yanwen Su; Xuecheng Zou; Xu Zhao
• Keywords: Flicker noise; Oscillator phase noise; Ring oscillator; Y-factor; Noise temperature; Noise generator

This paper presents an accurate ISF-based phase noise analysis method for LC/Ring oscillators. The proposed can simultaneously quantify the effect of flicker and thermal on noise. impulse sensitivity function (ISF) tool is used to evaluate sources. An equivalent resistor utilized assess contribution simplify process. Based method, performance a voltage-controlled oscillator (VCO) with source damping resistors discussed. Simulated in 180-nm TSMC 110-nm HHGRACE CMOS processes, accuracy verified. predicted consistent simulation results 1/f3 1/f2 region, achieving 1-dB diverse topologies.