Non-destructive evaluation of longitudinal elastic modulus of freestanding thin material layers using a waveguide-based method

• DOI: 10.1016/j.mtla.2022.101605
• Publication Date: 2022-10-20T23:20:48Z
• Authors: Léon Chiriatti; Violaine Tinard; Pierre François; Vincent Le Houérou
• Keywords: 02 engineering and technology; 0210 nano-technology