MCP performance improvement using alumina thin film

• DOI: 10.1016/j.nima.2017.06.049
• Publication Date: 2017-06-29T19:20:07Z
• Authors: Yuzhen Yang; Baojun Yan; Shulin Liu; Tianchi Zhao; Yang Yu; Kaile Wen; Yumei Li; Ming Qi
• Keywords: Microchannel plate detector; Dual layer; Deposition

Abstract The performance improvement using alumina thin film on a dual microchannel plate (MCP) detector for single electron counting was investigated. The alumina thin film was coated on all surfaces of the MCPs by atomic layer deposition method. It was found that the gain, the single electron resolution and the peak-to-valley ratio of the dual MCP detector were significantly enhanced by coating the alumina thin film. The optimum operating conditions of the new dual MCP detector have been studied.