On determining dead layer and detector thicknesses for a position-sensitive silicon detector

• DOI: 10.1016/j.nima.2017.12.082
• Publication Date: 2018-01-17T01:40:10Z
• Authors: J. Manfredi; Jenny Lee; W.G. Lynch; C.Y. Niu; M.B. Tsang; C. Anderson; J. Barney; K.W. Brown; Z. Chajecki; K.P. Chan; G. Chen; J. Estee; Z. Li; C. Pruitt; A.M. Rogers; A. Sanetullaev; H. Setiawan; R. Showalter; C.Y. Tsang; J.R. Winkelbauer; Z. Xiao; Z. Xu
• Keywords: 03 medical and health sciences; Physics - Instrumentation and Detectors; 0302 clinical medicine; FOS: Physical sciences; Instrumentation and Detectors (physics.ins-det); Nuclear Experiment (nucl-ex); Nuclear Experiment; 7. Clean energy

In this work, two particular properties of the position-sensitive, thick silicon detectors (known as the "E" detectors) in the High Resolution Array (HiRA) are investigated: the thickness of the dead layer on the front of the detector, and the overall thickness of the detector itself. The dead layer thickness for each E detector in HiRA is extracted using a measurement of alpha particles emitted from a $^{212}$Pb pin source placed close to the detector surface. This procedure also allows for energy calibrations of the E detectors, which are otherwise inaccessible for alpha source calibration as each one is sandwiched between two other detectors. The E detector thickness is obtained from a combination of elastically scattered protons and an energy-loss calculation method. Results from these analyses agree with values provided by the manufacturer.<br/>Accepted for publication in Nuclear Instruments and Methods in Physics Research<br/>