Development of a sapphire microstrip detector for gamma beam monitoring

• DOI: 10.1016/j.nima.2024.169752
• Publication Date: 2024-08-19T23:10:19Z
• Authors: G. Avoni; M. Benettoni; M. Bruschi; A. Cian; F. Dal Corso; U. Dosselli; K. Fleck; E. Gerstmayr; M. Giorato; P. Grutta; F. Lasagni Manghi; B. Margesin; M. Morandin; G. Sarri; S. Vasiukov; M. Zuffa
• Keywords: 0103 physical sciences; 530; 01 natural sciences

Artificial sapphire gained interest as radiation detector in the recent years, as an alternative to diamond. The research and development campaign to design, build and characterize a radiation-hard detector for gamma beam monitoring takes place in the scientific context of the Laser Und XFEL Experiment (LUXE) at DESY. The experiment requirements of beam profile reconstruction with micro-metric precision and radiation hardness led to a proposed sapphire microstrip detector design. This work introduces the scientific context for a sapphire microstrip gamma beam profiler (GBP) and describes the experimental campaign for sapphire characterization from early prototypes to the final development of a 192-strip detector.