Development of non-destructive testing (NDT) technique for HIPed interface by Compton scattering X-ray spectroscopy

• DOI: 10.1016/j.nme.2022.101171
• Publication Date: 2022-03-11T16:57:25Z
• Authors: Hiroshi Sakurai; Kosuke Suzuki; Shoya Ishii; Kazushi Hoshi; Takashi Nozawa; Hidetsugu Ozaki; Hiroto Haga; Hiroyasu Tanigawa; Yoji Someya; Masao Tsuchiya; Hiroshi Takeuchi; Naruki Tsuji
• Keywords: NDT; HIP interface; F82H steel; TK9001-9401; 0103 physical sciences; Nuclear engineering. Atomic power; High energy X-rays; Compton scattering; 01 natural sciences

High energy X-rays (115.56 keV) were used to measure the HIPed interface of F82H steel. The X-ray energy spectra of the samples were analyzed focusing on W and Ta fluorescence X-rays, Compton scattering and elastic scattering X-rays. The results suggest the presence of SiOx and TaOx at the HIP interface and the accumulation of W near the HIP interface. These results indicate that high-energy X-ray spectrum analysis can be a non-destructive testing technique (NDT) to evaluate precipitates at the HIP interface of F82H steel.