Cascading failures modeling of electronic circuits with degradation using impedance network

• DOI: 10.1016/j.ress.2023.109101
• Publication Date: 2023-01-18T20:34:37Z
• Authors: Yi Jin; Qingyuan Zhang; Yunxia Chen; Zhendan Lu; Tianpei Zu
• Keywords: 0103 physical sciences; 0202 electrical engineering, electronic engineering, information engineering; 02 engineering and technology; 01 natural sciences