Electronic structure of carbon nitride thin films studied by X-ray spectroscopy techniques

• DOI: 10.1016/j.tsf.2004.03.027
• Publication Date: 2004-06-09T20:23:03Z
• Authors: Niklas Hellgren; Jinghua Guo; Yi Luo; Conny Såthe; Akane Agui; Stepan Kashtanov; Joseph Nordgren; Hans Ågren; Jan-Eric Sundgren
• Keywords: XANES; Amorphous carbon; Carbon nitride

Magnetron-sputtered carbon nitride thin films with different structures and compositions were analyzed by X-ray and ultraviolet photoelectron spectroscopy (XPS and UPS), near-edge X-ray absorption ...