Atom probe specimen fabrication methods using a dual FIB/SEM

• DOI: 10.1016/j.ultramic.2007.02.024
• Publication Date: 2007-03-04T11:52:47Z
• Authors: D.W. Saxey; J.M. Cairney; D. McGrouther; T. Honma; S.P. Ringer
• Keywords: Electropolishing; Atom probe; Lift (data mining)

A dual FIB/SEM provides solutions to many challenges in atom probe specimen preparation. When combined with an in situ lift-out capability, the versatility of this tool allows almost any region of interest, in almost any geometry, to be placed at the apex of a specimen tip. Several preparation techniques have been developed in response to specific application requirements; for example, in cases where materials are not suitable for electropolishing, or where site-specific analysis is required. Two general techniques, with wide-ranging potential applications, are described in detail here. The first is a 'cut-out' technique that provides a relatively quick means of micro-tip specimen preparation from bulk material samples. The second method is a 'lift-out' technique that can be used in an in situ or ex situ mode and does not require the preparation of pre-sharpened mounting points.