Fast reconstruction of scanning transmission electron microscopy images using Markov random field model

• DOI: 10.1016/j.ultramic.2023.113811
• Publication Date: 2023-07-17T08:49:11Z
• Authors: Taichi Kusumi; Shun Katakami; Ryo Ishikawa; Kazuki Kawahara; Naoya Shibata; Masato Okada
• Keywords: Markov random field

In this study, we proposed a fast method of reconstruction for scanning transmission electron microscopy images. The proposed method is based on the Markov random field model and Bayesian inference, and we found that the method can reconstruct such images of sizes 512 × 512 and 264 × 240 in less than 200 ms and 100 ms, respectively. Furthermore, we showed that the method of reconstruction from multiple images without averaging them has better reconstruction performance than that from the averaged image.