Wide-Field Spectral Super-Resolution Mapping of Optically Active Defects in Hexagonal Boron Nitride

• DOI: 10.1021/acs.nanolett.9b00178
• Publication Date: 2019-03-13T16:40:38Z
• Authors: Jean Comtet; Evgenii Glushkov; Vytautas Navikas; Jiandong Feng; Vitaliy Babenko; Stephan Hofmann; Kenji Watanabe; Takashi Taniguchi; Aleksandra Radenovic
• Keywords: Hexagonal boron nitride

Point defects can have significant impact on the mechanical, electronic, and optical properties of materials. The development robust, multidimensional, high-throughput, large-scale characterization techniques is thus crucial for establishment integrated nanophotonic technologies material growth optimization. Here, we demonstrate potential wide-field spectral single-molecule localization microscopy (SMLM) determination ensemble as well spatial, spectral, temporal dynamics single in chemical vapor deposition (CVD)-grown irradiated exfoliated hexagonal boron-nitride We characterize heterogeneous response our samples identify at least two types CVD-grown materials, while flakes show predominantly only one type defects. analyze blinking kinetics emission each discuss their implications with respect to observed heterogeneity samples. Our study shows SMLM science paves way toward quantitative multidimensional mapping defect properties.