Mechanical and Electrical Comparative Studies of Widely Utilized Solar Perovskite Thin Films via Scanning Probe Microscopy

• DOI: 10.1021/acsaem.3c03236
• Publication Date: 2024-04-03T09:29:44Z
• Authors: Pimsuda Pansa-Ngat; Sirawit Kamnoedmanee; Nutthakan Semapet; Kitiphat Sinthipt...; Cheewita Suwancha...; Supavidh Burimart; Chaowaphat Seriwa...; Ko Ko Shin Thant; Pongsakorn Kanjan...
• Keywords: Scanning Probe Microscopy

Most perovskite publications explore only one or two formulas to achieve good performance and/or stability. In contrary, this work aims provide fair comparisons among different popularized recipes (MAPbI3, FAPbI3, FA0.1MA0.9PbI3, Cs0.2FA0.8PbI2.25Br0.75, Cs0.05FA0.81MA0.14PbI2.55Br0.45, and (PEA)2MA39Pb40I121) on the basis of mechanical electrical properties together with deformation stability via force curve analysis, photoconductive atomic microscopy (c-AFM), Kelvin probe (KPFM), Raman spectroscopy. Using c-AFM approach cantilever-sample interaction, nanoscale Young's modulus, adhesion force, photogenerated current mapping without reverse bias potential six distinct perovskites are investigated. Sheet resistance hardness test results further expand thin films' physical comprehension, relating future applications in flexible electronics. Additionally, function distributions explored KPFM. Surface terminations, along lattice contraction octahedral tilting, cause changes function. Lastly, was used investigate charge-morphology evolution under heat treatment. Triple-cation present themselves as most robust system by striking right balance between structural cationic rotation, high plastic deformation.