Schottky Barrier Height of Pd/MoS2 Contact by Large Area Photoemission Spectroscopy

Contact resistance
DOI: 10.1021/acsami.7b10974 Publication Date: 2017-10-16T13:34:03Z
ABSTRACT
MoS2, as a model transition metal dichalcogenide, is viewed potential channel material in future nanoelectronic and optoelectronic devices. Minimizing the contact resistance of metal/MoS2 junction critical to realizing MoS2-based In this work, Schottky barrier height (SBH) band structure high work function Pd on MoS2 have been studied by situ X-ray photoelectron spectroscopy (XPS). The analytical spot diameter XPS spectrometer about 400 μm, signal proportional detection area, so influence defect-mediated parallel conduction paths SBH does not affect measurement. charge redistribution detected characterization, which gives insight into physics suggests that interface engineering necessary lower for generation electronic applications.
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