On-Demand Generation of Single Silicon Vacancy Defects in Silicon Carbide

• DOI: 10.1021/acsphotonics.9b00451
• Publication Date: 2019-05-28T18:10:23Z
• Authors: Jun-Feng Wang; Qiang Li; Fei-Fei Yan; He Liu; Guo-Ping Guo; Wei-Ping Zhang; Xiong Zhou; Li-Ping Guo; Zhi-Hai Lin; Jin-Ming Cui; Xiao-Ye Xu; Jin-Shi Xu; Chuan-Feng Li; Guang-Can Guo
• Keywords: 02 engineering and technology; 0210 nano-technology

Defects in silicon carbide have been explored as promising spin systems in quantum technologies. However, for practical quantum metrology and quantum communication, it is critical to achieve on-dem...