Combined Use of Atomic Force Microscopy, X-ray Photoelectron Spectroscopy, and Secondary Ion Mass Spectrometry for Cell Surface Analysis

• DOI: 10.1021/la703741y
• Publication Date: 2008-02-01T10:01:09Z
• Authors: Etienne Dague; Arnaud Delcorte; Jean-Paul Latgé; Yves F. Dufrêne
• Keywords: Hydrophobin

Understanding the surface properties of microbial cells is a major challenge current microbiological research and key to efficiently exploit them in biotechnology. Here, we used three advanced analysis techniques with different sensitivity, probing depth, lateral resolution, that is, situ atomic force microscopy, X-ray photoelectron spectroscopy, secondary ion mass spectrometry, gain insight into conidia human fungal pathogen Aspergillus fumigatus. We show native ultrastructure, protein polysaccharide concentrations, amino acid composition mutants affected hydrophobin production are markedly from those wild-type, thereby providing novel cell wall architecture A. The results demonstrate power using multiple complementary for surfaces.