High-performance direct conversion X-ray detectors based on sintered hybrid lead triiodide perovskite wafers

• DOI: 10.1038/nphoton.2017.94
• Publication Date: 2017-06-19T15:04:04Z
• Authors: Shreetu Shrestha; René Fischer; Gebhard J. Matt; Patrick Feldner; Thilo Michel; Andres Osvet; Ievgen Levchuk; Benoit Merle; Saeedeh Golkar; Haiwei Chen; Sandro F. Tedde; Oliver Schmidt; Rainer Hock; Manfred Rührig; Mathias Göken; Wolfgang Heiss; Gisela Anton; Christoph J. Brabec
• Keywords: Triiodide; X-ray detector

Methyl ammonium lead triiodide perovskite wafers for application in direct conversion X-ray detectors are fabricated by a room-temperature sintering process. A conversion efficiency of 2,527 mC Gyaircm–2 under 70 kVp X-ray exposure is obtained.