EFM data mapped into 2D images of tip-sample contact potential difference and capacitance second derivative

• DOI: 10.1038/srep03352
• Publication Date: 2013-11-27T14:28:55Z
• Authors: S. Lilliu; C. Maragliano; M. Hampton; M. Elliott; M. Stefancich; M. Chiesa; M. S. Dahlem; J. E. Macdonald
• Keywords: Electrostatic force microscope; Indium tin oxide; Graphical user interface; Scanning Probe Microscopy; Sample (material); Volta potential

We report a simple technique for mapping Electrostatic Force Microscopy (EFM) bias sweep data into 2D images. The method allows simultaneous probing, in the same scanning area, of contact potential difference and second derivative capacitance between tip sample, along with height information. only required equipment consists microscope lift-mode EFM capable phase shift detection. designate this approach as Scanning Probe Potential (SPP-EFM). An open-source MATLAB Graphical User Interface (GUI) images acquisition, processing analysis has been developed. is tested Indium Tin Oxide (ITO) poly(3-hexylthiophene) (P3HT) nanowires organic transistor applications.