Characterization of nanoscale temperature fields during electromigration of nanowires

• DOI: 10.1038/srep04975
• Publication Date: 2014-05-15T10:16:07Z
• Authors: Wonho Jeong; Kyeongtae Kim; Youngsang Kim; Woochul Lee; Pramod Reddy
• Keywords: Electromigration

Quantitative studies of nanoscale heat dissipation (Joule heating) are essential for advancing nano-science and technology. Joule heating is widely expected to play a critical role in accelerating electromigration induced device failure. However, limitations quantitatively probing temperature fields—with resolution—have hindered elucidation the electromigration. In this work, we use ultra-high vacuum scanning thermal microscopy directly quantify fields nanowires during Our results unambiguously illustrate that begins at temperatures significantly lower than melting gold. Further, show voids predominantly accumulate cathode resulting both local hot spots asymmetric distributions. These provide novel insights into microscopic details spot evolution guide design reliable functional devices.