Fly-scan ptychography

• DOI: 10.1038/srep09074
• Publication Date: 2015-03-13T10:09:26Z
• Authors: Xiaojing Huang; Kenneth Lauer; Jesse N. Clark; Weihe Xu; Evgeny Nazaretski; Ross Harder; Ian K. Robinson; Yong S. Chu
• Keywords: info:eu-repo/classification/ddc/000; 02 engineering and technology; 0210 nano-technology; Article

AbstractWe report an experimental ptychography measurement performed in fly-scan mode. With a visible-light laser source, we demonstrate a 5-fold reduction of data acquisition time. By including multiple mutually incoherent modes into the incident illumination, high quality images were successfully reconstructed from blurry diffraction patterns. This approach significantly increases the throughput of ptychography, especially for three-dimensional applications and the visualization of dynamic systems.