The effect of STM parameters on tip-enhanced Raman spectra

Thiophenol Biasing Intensity
DOI: 10.1039/c7fd00164a Publication Date: 2017-05-17T15:23:15Z
ABSTRACT
In this work, we evaluate the dependence of tip-enhanced Raman (TER) spectra a monolayer thiophenol at Au(111) electrode on scanning tunneling microscope’s current set-point and bias voltage parameters. We find an increase TER intensity upon or decrease as expected from gap-distance reduction. The relations obtained follow theoretical model considering simple change when tuning mentioned that value affects to larger extent than set-point. Therefore it is advisable work in low-bias regime aiming for ultrasensitive measurements.
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