Simulations of the effect of an oxide on contact area measurements from conductive atomic force microscopy

• DOI: 10.1039/c8nr08605b
• Publication Date: 2018-12-11T17:46:13Z
• Authors: Rimei Chen; Sai Bharadwaj Vis...; Tevis D. B. Jacobs; Ashlie Martini
• Keywords: 02 engineering and technology; 0210 nano-technology

Atomistic simulations provide an approach to correcting the error in contact-area measurements from conductive atomic force microscopy for platinum with a thin insulating layer.