Transition from Schottky to Ohmic contacts in 2D Ge/GaAs heterostructures with high tunneling probability

Ohmic contact Schottky effect Metal–semiconductor junction
DOI: 10.1039/d3cp06189b Publication Date: 2024-03-01T09:22:36Z
ABSTRACT
Biaxial strain and electric field engineering induced the Schottky to Ohmic contact transition of a germanene/GaAs metal–semiconductor junction with electron injection efficiency exceeding 27%.
SUPPLEMENTAL MATERIAL
Coming soon ....
REFERENCES (32)
CITATIONS (4)