Transition from Schottky to Ohmic contacts in 2D Ge/GaAs heterostructures with high tunneling probability
Ohmic contact
Schottky effect
Metal–semiconductor junction
DOI:
10.1039/d3cp06189b
Publication Date:
2024-03-01T09:22:36Z
AUTHORS (7)
ABSTRACT
Biaxial strain and electric field engineering induced the Schottky to Ohmic contact transition of a germanene/GaAs metal–semiconductor junction with electron injection efficiency exceeding 27%.
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