Object recognition based on shape interest points descriptor

• DOI: 10.1049/ell2.13198
• Publication Date: 2024-05-09T05:18:46Z
• Authors: Lei Zhang; Jiexin Pu
• Keywords: pattern recognition; 0202 electrical engineering, electronic engineering, information engineering; Electrical engineering. Electronics. Nuclear engineering; 02 engineering and technology; object recognition; image processing; TK1-9971

AbstractConsidering the defect of object recognition with single global feature or local feature, in this letter the authors propose a shape interest points descriptor (SIPD) for object recognition. Particularly, the authors extract the shape features by the improved HU moments and then interest points by Speeded up Robust Feature (SURF). Object recognition is carried out by similarity measure. Because the influence of the improved HU moments and SURF for object recognition is different, the two different similarity measures are fused effectively by using different weight factors. Experimental results show that the author’ proposed method is effective and robust to the changes of scale, viewing angle, illumination and noise when compared with the other representative methods.