Deposition and characterization of fullerene films

• DOI: 10.1063/1.106095
• Publication Date: 2002-07-26T13:31:59Z
• Authors: A. F. Hebard; R. C. Haddon; R. M. Fleming; A. R. Kortan
• Keywords: Sublimation

Thermal sublimation of pure C60 and C70 has been used for depositing well-characterized fullerene films on a variety substrates. Film purity is determined by infrared absorption spectra the extent crystallinity face-centered cubic structure x rays. Thickness-dependent optical electrical measurements reveal uniform over thickness range 200–1000 Å. We obtain coefficients having values between those Si Ge relative permittivity value close to that amorphous SiO2.