Differential interference contrast x-ray microscopy with submicron resolution

• DOI: 10.1063/1.1360776
• Publication Date: 2002-07-26T13:24:54Z
• Authors: Thomas Wilhein; Burkhard Kaulich; Enzo Di Fabrizio; Fillipo Romanato; Stefano Cabrini; Jean Susini
• Keywords: Interference microscopy; Bright-field microscopy; Dark field microscopy

Progress in lithography and nanofabrication [E. Di Fabrizio et al., Nature (London) 401, 895 (1999)] has made it possible to apply differential interference contrast (DIC) x-ray microscopy using an original doublet lens based on two specially developed zone plates. Switching from bright-field imaging (absorption contrast) DIC, we observe, similar visible-light microscopy, a dramatic increase image for weak absorbing samples. We anticipate that this technique will have significant impact may play role comparable DIC microscopy.