Metalorganic vapor-phase epitaxial growth and photoluminescent properties of Zn1−xMgxO(0⩽x⩽0.49) thin films
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MGXZN1-XO
02 engineering and technology
EMISSION
0210 nano-technology
DOI:
10.1063/1.1405811
Publication Date:
2002-07-26T12:44:22Z
AUTHORS (3)
ABSTRACT
High-quality Zn1−xMgxO(0.00⩽x⩽0.49) thin films were epitaxially grown at 500–650 °C on Al2O3(00⋅1) substrates using metalorganic vapor-phase epitaxy. By increasing the Mg content in up to 49 at. %, c-axis constant of decreased from 5.21 5.14 Å and no significant phase separation was observed as determined by x-ray diffraction measurements. Furthermore, near-band-edge emission peak position showed blueshifts 100, 440, 685 meV levels 9, 29, respectively. Photoluminescent properties alloy are also discussed.
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