Er-doped silicon nanowires with 1.54μm light-emitting and enhanced electrical and field emission properties

Erbium
DOI: 10.1063/1.2777181 Publication Date: 2007-08-31T23:12:49Z
ABSTRACT
Erbium-doped silicon nanowires have been grown via a vapor transport and condensation method with ErCl3∙6H2O powder as part of the source in one step. The Er-doped exhibit room temperature photoluminescence at wavelength 1.54μm, ideal for optical communication. From I-V measurements, resistivity 4.2at.% Si was determined to be 1.5×10−2Ωcm. were found possess excellent field emission properties enhancement factor high 1260. rich variety enhanced physical exhibited by points versatile applications advanced devices.
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