Antireflective downconversion ZnO:Er3+,Yb3+ thin film for Si solar cell applications

• DOI: 10.1063/1.4906976
• Publication Date: 2015-02-02T20:35:12Z
• Authors: R. Elleuch; R. Salhi; J.-L. Deschanvres; R. Maalej
• Keywords: Anti-reflective coating; Wurtzite crystal structure

Hexagonal wurtzite phased ZnO:Er3+/Yb3+ thin films with various Yb concentrations were deposited on Si(111) substrate by Aerosol Assisted Chemical Vapor Deposition process. Post-annealed at 1000 °C in air atmosphere showed a crystallinity enhancement. Yb3+ (4F7/2 → 4F5/2) nm emission increased the increase of concentration emanating from an Er-Yb energy transfer. The reflectance percentage 12% was achieved [250–1000 nm] range, and refractive index 1.97 obtained for 632 wavelength. These results suggest that (3 mol. % Er, 9 Yb) codoped film is highly efficient antireflective downconversion layer enhancing Si solar cell efficiency.