A novel design of a scanning probe microscope integrated with an ultramicrotome for serial block-face nanotomography
Scanning Probe Microscopy
DOI:
10.1063/1.4975202
Publication Date:
2017-02-08T20:23:27Z
AUTHORS (8)
ABSTRACT
We present a new concept of combined scanning probe microscope (SPM)/ultramicrotome apparatus. It enables “slice-and-view” nanotomography measurements and 3D reconstruction the bulk sample nanostructure from series SPM images after consecutive ultrathin sections. The is fixed on flat XYZ piezostage mounted ultramicrotome arm. measuring head with cantilever tip laser-photodiode detection system approaches for block-face surface immediately sectioning performed. moved along guides that are also Thereby, relative dysfunctional displacements tip, sample, knife minimized. design open frontal optical access to adapted high-resolution lenses correlative SPM/optical microscopy applications. can be used in wide range applications study nanostructures biological objects, biomaterials, polymer nanocomposites, nanohybrid materials various modes.
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