Spin injection into silicon detected by broadband ferromagnetic resonance spectroscopy

• DOI: 10.1063/1.4983012
• Publication Date: 2017-05-02T15:00:55Z
• Authors: Ryo Ohshima; Stefan Klingler; Sergey Dushenko; Yuichiro Ando; Mathias Weiler; Hans Huebl; Teruya Shinjo; Sebastian T. B. G...; Masashi Shiraishi
• Keywords: Spin pumping

We studied the spin injection in a NiFe(Py)/Si system using broadband ferromagnetic resonance spectroscopy. The Gilbert damping parameter of Py layer on top Si channel was determined as function doping concentration and thickness. For fixed thickness, we observed an increase with decreasing resistivity channel. concentration, measured increasing for No found Py/Si samples insulating interlayer. attribute our observations to enhanced into low-resistivity by pumping.