Permittivity measurement of high-frequency substrate based on the double-sided parallel-strip line resonator method

• DOI: 10.1063/5.0214359
• Publication Date: 2024-07-01T12:35:00Z
• Authors: Ronghua Shen; Chong Gao; Nan Chen; Hui Zhu; Yang Zhou; Chengyong Yu; En Li; Yunpeng Zhang
• Keywords: Line (geometry)

With the development of 5G technology, accurate measurement complex permittivity a printed circuit board (PCB) in wide frequency range is crucial for design high-frequency circuits. In this paper, microwave device and method based on double-sided parallel-strip line (DSPSL) resonator have been developed to measure typical PCBs vertical direction. The includes DSPSL resonator, coupling probe, pressure monitor, Farran C4209 vector network analyzer (100 K 9 GHz), FEV-10-PR-0006 multiplier (75-110 GHz). Based transmission theory, physical model was established, relative loss angle tangent value dielectric substrate were calculated using conformal transformation. To excite probe with good effect designed, which consists microstrip (MSL) transition structure an MSL-WR10 rectangular waveguide converter. reduce air gap between sample metal guide band support block, improve test accuracy, mechanical added top resonator. we used four PCBs, namely, polytetrafluoroethylene, Rogers RT/duroid®5880, RO3006®, RO3010®. results show that maximum error less than 3.05%, 1.27 × 10-4.