Secondary roughness effect of surface microstructures on secondary electron emission and multipactor threshold for PTFE-filled and PI-filled single ridge waveguides

• DOI: 10.1088/1361-6463/ad36d0
• Publication Date: 2024-03-22T22:20:53Z
• Authors: Xiangchen Meng; Yanan Xu; Zhuoxi Lian; Jiyuan Wang; Dan Wang; Kangcheng Qi
• Keywords: Secondary emission; Secondary electrons

Abstract Secondary electron yield (SEY) is a dominant factor in determining the multipactor threshold. In this study, we analyzed secondary roughness effect of surface microstructures for plastic dielectric on SEY reduction and mitigation. A single ridge waveguide (SRW) operating Ku-band, filled with polytetrafluoroethylene (PTFE) or polyimide (PI), was designed dielectric–metal gap. By employing femtosecond laser, periodic were fabricated PTFE PI surfaces to suppress SEY. The peak values decreased from 2.05 1.40 1.37 1.07 by porous surface. morphologies cross-sectional images demonstrated existence structures. Via simulation, obtained thresholds 8496 W, 12 374 9397 W SRWs untreated surface, ideal (without roughness), real (with roughness). Similar works implemented PI-filled SRWs, resulting simulated 7640 11 327 9433 W. results indicate that may not be effectively suppressed under influence structures such as velvet foam. Besides, simulation indicated radio frequency electric field could extract electrons microstructures, weakening mitigation multipactor. impact charging motion also considering energy distribution. It suggested dielectrics lead decrease charge density electrostatic strength, self-extinguishing lowering This study provides an in-depth analysis organic dielectrics, which makes significant sense further investigation