Imaging individual solute atoms at crystalline imperfections in metals

• DOI: 10.1088/1367-2630/ab5cc4
• Publication Date: 2019-11-28T23:00:38Z
• Authors: Shyam Katnagallu; Leigh T Stephenson; Isabelle Mouton; Christoph Freysoldt; Aparna P A Subram...; Jan Jenke; Alvin N Ladines; Steffen Neumeier; Thomas Hammerschmidt; Ralf Drautz; Jörg Neugebauer; François Vurpillot; Dierk Raabe; Baptiste Gault
• Keywords: dislocation segregation; Technology; ddc:600; Physics - Instrumentation and Detectors; Science; QC1-999; atomic resolution; FOS: Physical sciences; analytical-field ion microscopy; 02 engineering and technology; time-of-flight mass-spectroscopy; 530; 01 natural sciences; 0103 physical sciences; ddc:530; [PHYS.PHYS.PHYS-INS-DET]Physics [physics]/Physics [physics]/Instrumentation and Detectors [physics.ins-det]; density functional theory; Condensed Matter - Materials Science; [PHYS.PHYS.PHYS-ATOM-PH]Physics [physics]/Physics [physics]/Atomic Physics [physics.atom-ph]; Physics; Q; Materials Science (cond-mat.mtrl-sci); 600; Instrumentation and Detectors (physics.ins-det); [PHYS.PHYS.PHYS-GEN-PH]Physics [physics]/Physics [physics]/General Physics [physics.gen-ph]; [PHYS.COND.CM-MS]Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci]; info:eu-repo/classification/ddc/600; 0210 nano-technology

Abstract Directly imaging all atoms constituting a material and, maybe more importantly, crystalline defects that dictate materials’ properties, remains formidable challenge. Here, we propose new approach to chemistry-sensitive field-ion microscopy (FIM) combining FIM with time-of-flight mass-spectrometry ( tof-ms ). Elemental identification and correlation images enabled by data mining of combined delivers truly analytical-FIM (A-FIM). Contrast variations due different chemistries is also interpreted from density-functional theory (DFT). A-FIM has true atomic resolution demonstrate how the technique can reveal presence individual solute at specific positions in microstructure. The performance this showcased revealing Re formed Ni–Re binary alloy during creep deformation. atomistic details offered allowed us directly compare our results simulations, tackle long-standing question extends lifetime Ni-based superalloys service high-temperature.