Measurement of the Nonlinear Loss and Effective Free Carrier Lifetime in Silicon Microring Resonators
Free carrier absorption
Transmission coefficient
Waveguide
Two-Photon Absorption
DOI:
10.1109/jlt.2024.3354105
Publication Date:
2024-01-15T21:17:11Z
AUTHORS (6)
ABSTRACT
A methodology is presented to characterize the nonlinear absorption loss coefficient and effective free carrier lifetime in silicon ring resonators at high intra-ring optical power density. The proposed uses a continuous-wave pump-probe measurement capture distortion-free transmission spectra regime of absorption. measured using this method 30-40% higher than that obtained with single high-power laser. also reveals sharply increases beyond ∼11.6 mW bus waveguide for design highest quality-factor, most likely due saturation trap states by electrons holes generated two-photon
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