Genetic basis of resistance to southern corn leaf blight in the maize multi‐parent population and diversity panel

• DOI: 10.1111/pbi.13967
• Publication Date: 2022-11-16T13:59:13Z
• Authors: Gengshen Chen; Yingjie Xiao; Sha Dai; Zhikang Dai; Xiaoming Wang; Bailin Li; Jennifer S. Jaqueth; Wenqiang Li; Zhibing Lai; Junqiang Ding; Jianbing Yan
• Keywords: Epistasis; Inbred strain; Candidate gene; Association mapping; Genetic architecture

Summary Southern corn leaf blight (SLB), caused by the necrotrophic pathogen Cochliobolus heterostrophus , is one of maize foliar diseases and poses a great threat to production around world. Identification genetic variations underlying resistance SLB paramount importance yield quality. Here, we used random‐open‐parent association mapping population containing eight recombinant inbred line populations panel consisting 513 diversity lines with high‐density markers dissect basis resistance. Overall, 109 quantitative trait loci (QTLs) predominantly small or moderate additive effects, little epistatic effects were identified. We found 35 (32.1%) novel in comparison reported QTLs. revealed that resistant alleles significantly enriched tropical accessions frequency about half decreased during adaptation process owing selection agronomic traits. A large number annotated genes located SLB‐resistant QTLs shown be involved plant defence pathways. Integrating genome‐wide study, transcriptomic profiling, resequencing gene editing, identified ZmFUT1 MYBR92 as putative responsible for major C. . Our results present comprehensive insight into provide direct targets crop improvement.