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Photoelectron beam from semiconductor photocathodes leading to new inspection technologies

DOI: 10.1117/12.3010730 Publication Date: 2024-02-23T21:48:36Z
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AUTHORS (10)
Tomohiro Nishitani
Yuta Arakawa
Kotaro Niimi
Yohei Otsuka
Daiki Sato
Atsushi Koizumi
Haruka Shikano
Hokuto Iijima
Yoshio Honda
Hiroshi Amano
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