Imaging of a Polycrystalline Silicon Solar Cell Using a Laser Terahertz Emission Microscope

• DOI: 10.1143/apex.5.112301
• Publication Date: 2012-10-23T02:24:43Z
• Authors: Hidetoshi Nakanishi; Shogo Fujiwara; Kazuhisa Takayama; Iwao Kawayama; Hironaru Murakami; Masayoshi Tonouchi
• Keywords: Polycrystalline silicon; Photoelectric effect

We employed a laser terahertz (THz) emission microscope (LTEM) as novel tool for evaluating solar cells. LTEM images are obtained by exciting polycrystalline silicon cell with femtosecond illumination and visualizing the local distribution of optical response. THz signals also provide various types information, such screening effect built-in electrical field near pn junctions. These results indicate that this technique can be used to evaluate photoelectric conversion efficiency dynamic behavior optically excited carriers in