Measurement of Secondary Electron Emission Coefficient (γ) of MgO Protective Layer with Various Crystallinities

• DOI: 10.1143/jjap.37.7015
• Publication Date: 2002-10-01T22:51:25Z
• Authors: Eun-Ha Choi; Hyun-Joo Oh; Young-Guon Kim; Jae-Jun Ko; Jae-Yong Lim; Jin-Goo Kim; Dae-Il Kim; Guangsup Cho; Seung-Oun Kang
• Keywords: Plasma display; Secondary emission

The secondary electron emission coefficient γ of a MgO protective layer with various crystallinities has been successfully measured by the γ-focused ion beam system complete elimination charge accumulation problem scanning-area adjustment techniques. It is found that (111) surface highest from 0.14 to 0.26 in comparison other films (200) and (220) for operating Ne + ions, while ranged 0.03 0.24 Ar under energies 50 eV 500 throughout this experiment. These observations explain why crystallinity plays an important role lowering firing voltages AC plasma display panel compared crystallinities.