Diffusion-Related SOFC Stack Degradation

• DOI: 10.1149/07801.2223ecst
• Publication Date: 2017-07-24T20:05:12Z
• Authors: Norbert H. Menzler; Alexander Beez; Nikolas Grünwald; Doris Sebold; Qingping Fang; Robert Vaßen
• Keywords: Degradation

As part of two different stack tests with four-plane short stacks and their intensive post-test characterization, varying diffusion-related degradation mechanisms were investigated. The first was a short-term test (~1250h) chromium evaporation protection layers on the air-side metallic interconnect frame second long-term endurance (~ 35,000h). For stack, planes coated manganese oxide layer applied by wet powder spraying (WPS), while other manganese–cobalt–iron spinel atmospheric plasma (APS). voltage loss in WPS-coated markedly higher than those means APS. Finally, it shown that microstructure plays key role minimizing Cr evaporation. In this gas-phase diffusion prevails over degradation. severe due to solid-state observed. This paper draws an interaction hypothesis.