Characterization of Thin Copper Diffusion Barrier Layer in Beryllium Capsules

• DOI: 10.13182/fst13-tfm20-16
• Publication Date: 2015-05-28T17:38:46Z
• Authors: H. Xu; K. P. Youngblood; H. Huang; J. J. Wu; K. A. Moreno; A. Nikroo; S. J. Shin; Y. M. Wang; A. V. Hamza
• Keywords: 0103 physical sciences; 01 natural sciences

The point design of beryllium capsules includes three Cu-doped layers in a 160-μm-thick beryllium shell to achieve the desired X-ray absorption profile. The beryllium capsules were deposited on glo...