Nanodisplacement measurement using spectral shifts in a white-light interferometer

• DOI: 10.1364/ao.47.006334
• Publication Date: 2008-11-19T20:22:05Z
• Authors: Maruthi M. Brunda...; Nirmal K. Viswana...; D. Narayana Rao
• Keywords: White light interferometry; Optical path length; Spectral envelope

We report a novel experimental method to measure nanometer displacements using wavelength shifts of spectral peaks around switch or singular phase points in the interference spectra due temporal correlation Michelson interferometer illuminated by broadband white-light source. Dramatic changes characteristics are recorded as function path difference between interfering beams position. These then compared with measurements far from it order demonstrate higher sensitivities involved proposed method.