Tilt (in)variant lateral scan in oblique plane microscopy: a geometrical optics approach

• DOI: 10.1364/boe.389654
• Publication Date: 2020-05-18T20:30:06Z
• Authors: Manish Kumar; Yevgenia Kozorovi...
• Keywords: Distortion (music)

Oblique plane microscopy (OPM) is a single objective light-sheet that performs three dimensional (3D) imaging by axial scan of the generated light-sheet. Recently, multiple techniques for lateral scanning in OPM have emerged. However, their suitability geometrically distortion free 3D imaging, which essentially requires constant tilt scan, has not been evaluated. In this work, we use geometrical optics approach and derive analytical relationship amount variance planar mirror based scanned oblique illumination (SOPi) arrangement. We experimentally validate derived it to arrive at an optimized scanner geometry understand its associated limitations. discuss effects on optical aberrations field view optimized, invariant, systems. also provide experimental strategies enabling precise alignment invariance, as well open source platform rapid design new microscopes.