Doppler-Shift Emulation Using Highly Time-Refracting TCO Layer

• DOI: 10.1364/cleo_qels.2016.ff2d.6
• Publication Date: 2016-05-31T21:06:30Z
• Authors: A.M. Shaltout; M. Clerici; N. Kinsey; R. Kaipurath; J. Kim; E. G. Carnemolla; D. Faccio; A. Boltasseva; V.M. Shalaev; Marcello Ferrera

A wavelength shift of 15 nm is obtained for near-infrared (1250 nm) pulses interacting with a temporally engineered Al-doped-ZnO layer. The underlying time-refraction process driven by an intense, <100 fs pulse at 785 nm.