Hyperspectral Microscopy with Broadband Infrared Frequency Combs

• DOI: 10.1364/cleo_si.2019.sf1e.4
• Publication Date: 2019-05-08T00:25:50Z
• Authors: Henry Timmers; Abijith Kowligy; Alexander J. Lind; Nima Nader; Jonah Shaw; Dobryna Zalvidea; Jens Biegert; Scott A. Diddams
• Keywords: Infrared microscopy; Chemical Imaging

We present a new modality for infrared, hyperspectral microscopy using dual-comb, electro-optic sampling of octave-spanning infrared frequency combs. obtain images SU8 test patterns on Si wafers with spatial resolution 12 µm.