Artifact characterization and reduction in scanning X-ray Zernike phase contrast microscopy

• DOI: 10.1364/oe.23.013278
• Publication Date: 2015-05-12T21:48:15Z
• Authors: Ismo Vartiainen; Christian Holzner; Istvan Mohacsi; Petri Karvinen; Ana Diaz; Gaia Pigino; Christian David
• Keywords: 02 engineering and technology; 0210 nano-technology

Zernike phase contrast microscopy is a well-established method for imaging specimens with low absorption contrast. It has been successfully implemented in full-field using visible light and X-rays. In Cowley's reciprocity principle connects scanning imaging. Even though the discussed by several authors over past thirty years, only recently it was experimentally verified X-ray microscopy. this paper, we investigate image formation particular detailed focus on origin of artifacts that are typically associated We demonstrate X-rays effect mask design halo present an optimized respect to photon efficiency artifact reduction. Similarly, due observations conclusions work have direct applicability as well.