Three-dimensional super-resolution high-throughput imaging by structured illumination STED microscopy

• DOI: 10.1364/oe.26.020920
• Publication Date: 2018-07-31T22:37:06Z
• Authors: Yi Xue; Peter T. C. So
• Keywords: STED microscopy; Photobleaching

Stimulated emission depletion (STED) microscopy is able to image fluorescence labeled samples with nanometer scale resolution. STED typically a point-scanning method, limited by the high intensity requirement of beam. With development peak power lasers, two dimensional parallel has been developed. Here, we develop theoretical basis for extending three imaging in parallel. This method uses structured illumination (SI) generates pattern. Compared microscopy, 3D SI-STED modulation along light propagation direction without requiring higher laser power. not only achieves axial super-resolution but also greatly reduces photobleaching and photodamage volumetric imaging.