Exploiting the P L_2,3 absorption edge for optics: spectroscopic and structural characterization of cubic boron phosphide thin films

• DOI: 10.1364/ome.6.003946
• Publication Date: 2016-11-30T16:05:55Z
• Authors: S. P. Huber; V. V. Medvedev; J. Meyer-Ilse; E. Gullikson; B. Padavala; J. H. Edgar; J. M. Sturm; R. W. E. van de K...; D. Prendergast; F. Bijkerk
• Keywords: XANES; Absorption edge; Crystal (programming language)

The transmission of cubic boron phosphide (c-BP) thin films, prepared by chemical vapor deposition (CVD), was evaluated near the phosphorous L 2,3 and K absorption edge.The c-BP films were analyzed with electron microscopy (TEM), X-ray photoelectron spectroscopy (XPS) near-edge (XANES), to study their structural properties.The TEM analysis reveals that initially grows in islands.The merging P , B edges culminates a sharp feature starting at 130 eV, showing can be used applications require relatively transparent material energy range just below feature.Due experimental constraints samples grown temperature significantly for optimal crystal growth.XANES showed that, as result reduced quality, intensities transitions are compared those high quality crystalline reference samples.Optimizing BP will increase contrast across edge.