High-resolution single-shot spectral monitoring of hard x-ray free-electron laser radiation

• DOI: 10.1364/optica.2.000912
• Publication Date: 2015-10-15T13:38:32Z
• Authors: M. Makita; P. Karvinen; D. Zhu; P. N. Juranic; J. Grünert; S. Cartier; J. H. Jungmann-Smith; H. T. Lemke; A. Mozzanica; S. Nelson; L. Patthey; M. Sikorski; S. Song; Y. Feng; C. David
• Keywords: Single shot; Free-electron laser

We have developed an on-line spectrometer for hard x-ray free-electron laser (XFEL) radiation based on a nanostructured diamond diffraction grating and bent crystal analyzer.Our method provides high spectral resolution, interferes negligibly with the XFEL beam, can withstand intense pulses at repetition rates of >100 Hz.The is capable providing shot-to-shot information normalization data obtained in scientific experiments optimization accelerator operation parameters.We demonstrated these capabilities setup Linac Coherent Light Source, self-amplified spontaneous emission mode full energy >1 mJ 120 Hz rate, obtaining resolving power E ∕δE > 3 × 10 4 .The device was also used to monitor effects pulse duration down 8 fs by analysis spike width.