3D x-ray imaging of continuous objects beyond the depth of focus limit

• DOI: 10.1364/optica.5.001078
• Publication Date: 2018-08-31T14:33:25Z
• Authors: M. A. Gilles; Y. S. G. Nashed; M. Du; C. Jacobsen; S. M. Wild
• Keywords: Ptychography; Sample (material)

X-ray ptychography is becoming the standard method for sub-30 nm imaging of thick extended samples. Available algorithms and computing power have traditionally restricted sample reconstruction to 2D slices. We build on recent progress in optimization high performance solve ptychographic phase retrieval problem directly 3D. Our approach addresses samples that do not fit entirely within depth focus system. Such pose additional challenges because internal diffraction effects sample. demonstrate our a computational modeled with 17 million complex variables.