Infrared Microsampling by Diffuse Reflectance Fourier Transform Spectrometry

• DOI: 10.1366/0003702804731311
• Publication Date: 2005-08-13T13:12:14Z
• Authors: Michael P. Fuller; Peter R. Griffiths
• Keywords: Diffuse reflection; Attenuated total reflection

It is shown that diffuse reflectance techniques enable increased sensitivity to be obtained for infrared microsampling compared with the use of KBr micropellets. When nonabsorbing matrices, such as KCl, are used, detection limits less than 10 ng samples observed. Samples absorbed on graphitized substrates, which have a fairly strong general absorption but few intense bands, may also studied at somewhat reduced sensitivity. Diffuse Fourier transform spectrometry does not appear particularly useful studying adsorbates silica gel, only absorber has surface so active small changes in structure can change spectrum significantly. Extraction sample spots from thin layer chromatography plates followed by deposition onto KCl yields much better results situ measurements.